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SPIE Digital Library
! Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XII
Editor(s):
Sadwick, Laurence
Information Provider:
SPIE Digital Library
ISBN: 9781510624764
Publication Date:
2019
Book
! Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIII
Editor(s):
Sadwick, Laurence
Information Provider:
SPIE Digital Library
ISBN: 9781510633216
Publication Date:
2020
Book
! Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIV
Editor(s):
Sadwick, Laurence
Information Provider:
SPIE Digital Library
ISBN: 9781510642058
Publication Date:
2021
Book
! Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV
Editor(s):
Sadwick, Laurence
Information Provider:
SPIE Digital Library
ISBN: 9781510648715
Publication Date:
4648
Book
! Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XVI
Editor(s):
Sadwick, Laurence P.
Information Provider:
SPIE Digital Library
ISBN: 9781510659452
Publication Date:
5055
Book
! Terrorism and Counter-Terrorism Methods and Technologies
Editor(s):
Ishimoto, Wade
Information Provider:
SPIE Digital Library
ISBN: 9780819423351
Publication Date:
1997
Book
! Test and Evaluation of Infrared Detectors and Arrays
Editor(s):
Hoke, Forney
Information Provider:
SPIE Digital Library
ISBN: 9780819401441
Publication Date:
1989
Book
! Test and Evaluation of IR Detectors and Arrays II
Editor(s):
Hoke, Forney
Information Provider:
SPIE Digital Library
ISBN: 9780819408518
Publication Date:
1992
Book
! Test and Measurement Applications of Optoelectronic Devices
Editor(s):
Chin, Aland
Information Provider:
SPIE Digital Library
ISBN: 9780819443878
Publication Date:
2002
Book
! Testing and Evaluation of Infrared Imaging Systems, Third Edition
Author(s):
Holst, Gerald
Information Provider:
SPIE Digital Library
ISBN: 9780819472472
Publication Date:
2008
Book
! Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV
Editor(s):
Fallahi, Mahmoud
Information Provider:
SPIE Digital Library
ISBN: 9780819430960
Publication Date:
1999
Book
! Testing, Reliability, and Application of Micro- and Nano-Material Systems
Editor(s):
Meyendorf, Norbert
Information Provider:
SPIE Digital Library
ISBN: 9780819448507
Publication Date:
2003
Book
! Testing, Reliability, and Application of Micro- and Nano-Material Systems II
Editor(s):
Meyendorf, Norbert
Information Provider:
SPIE Digital Library
ISBN: 9780819453099
Publication Date:
2004
Book
! Testing, Reliability, and Application of Micro- and Nano-Material Systems III
Editor(s):
Geer, Robert
Information Provider:
SPIE Digital Library
ISBN: 9780819457479
Publication Date:
2005
Book
! Testing, Reliability, and Application of Micro- and Nano-Material Systems IV
Editor(s):
Geer, Robert
Information Provider:
SPIE Digital Library
ISBN: 9780819462282
Publication Date:
2006
Book
! Testing, Reliability, and Applications of Optoelectronic Devices
Editor(s):
Wang, Shing-Chung
Information Provider:
SPIE Digital Library
ISBN: 9780819439635
Publication Date:
2001
Book
! Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
Editor(s):
Wadekar, Shekhar
Information Provider:
SPIE Digital Library
ISBN: 9780819402165
Publication Date:
1990
Book
! The 20th AIPR Workshop: Computer Vision Applications: Meeting the Challenges
Editor(s):
Lurie, Joan
Information Provider:
SPIE Digital Library
ISBN: 9780819407658
Publication Date:
1992
Book
! The Abundant Promise of Ultrasound in Neurosurgery: A Broad Overview and Thoughts on Ethical Paths to Realizing Its Benefits
Author(s):
Manbachi, Amir
Information Provider:
SPIE Digital Library
ISBN: 9781510657250
Publication Date:
2022
Book
! The Art and Science of Holography: A Tribute to Emmett Leith and Yuri Denisyuk
Author(s):
Caulfield, H. John
Information Provider:
SPIE Digital Library
ISBN: 9780819450197
Publication Date:
2004
Book
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