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Content associated with ARDI
ARDI offers access to scholarly literature from diverse fields of science and technology. It promotes the integration of developing and least developed countries into the global knowledge economy, reinforcing the knowledge infrastructure and supporting researchers in creating and developing new solutions to technical challenges on a local and global level.
! Metamaterials VIII
Editor(s):
Kuzmiak, Vladimír
Information Provider:
SPIE Digital Library
ISBN: 9780819495730
Publication Date:
2013
Book
! Metamaterials X
Editor(s):
Boardman, Allan
Information Provider:
SPIE Digital Library
ISBN: 9781510601284
Publication Date:
2016
Book
! Metamaterials X
Editor(s):
Kuzmiak, Vladimír
Information Provider:
SPIE Digital Library
ISBN: 9781628416237
Publication Date:
2015
Book
! Metamaterials XI
Editor(s):
Boardman, Allan
Information Provider:
SPIE Digital Library
ISBN: 9781510618688
Publication Date:
2018
Book
! Metamaterials XI
Editor(s):
Kuzmiak, Vladimír
Information Provider:
SPIE Digital Library
ISBN: 9781510609556
Publication Date:
2017
Book
! Metamaterials XII
Editor(s):
Kuzmiak, Vladimír
Information Provider:
SPIE Digital Library
ISBN: 9781510627161
Publication Date:
2019
Book
! Metamaterials, Metadevices, and Metasystems 2015
Editor(s):
Engheta, Nader
Information Provider:
SPIE Digital Library
ISBN: 9781628417104
Publication Date:
2015
Book
! Metamaterials, Metadevices, and Metasystems 2016
Editor(s):
Engheta, Nader
Information Provider:
SPIE Digital Library
ISBN: 9781510602274
Publication Date:
2016
Book
! Metamaterials, Metadevices, and Metasystems 2017
Editor(s):
Engheta, Nader
Information Provider:
SPIE Digital Library
ISBN: 9781510611436
Publication Date:
2017
Book
! Metamaterials, Metadevices, and Metasystems 2018
Editor(s):
Engheta, Nader
Information Provider:
SPIE Digital Library
ISBN: 9781510620094
Publication Date:
2018
Book
! Metamaterials: Fundamentals and Applications
Editor(s):
Noginov, Mikhail
Information Provider:
SPIE Digital Library
ISBN: 9780819472496
Publication Date:
2008
Book
! Metamaterials: Fundamentals and Applications 2014
Editor(s):
Engheta, Nader
Information Provider:
SPIE Digital Library
ISBN: 9781628411874
Publication Date:
2014
Book
! Metamaterials: Fundamentals and Applications II
Editor(s):
Noginov, Mikhail
Information Provider:
SPIE Digital Library
ISBN: 9780819476821
Publication Date:
2009
Book
! Metamaterials: Fundamentals and Applications III
Editor(s):
Boardman, Allan
Information Provider:
SPIE Digital Library
ISBN: 9780819482501
Publication Date:
2010
Book
! Metamaterials: Fundamentals and Applications IV
Editor(s):
Boardman, Allan
Information Provider:
SPIE Digital Library
ISBN: 9780819487032
Publication Date:
2011
Book
! Metamaterials: Fundamentals and Applications V
Editor(s):
Boardman, Allan
Information Provider:
SPIE Digital Library
ISBN: 9780819491725
Publication Date:
2012
Book
! Metamaterials: Fundamentals and Applications VI
Editor(s):
Boardman, Allan
Information Provider:
SPIE Digital Library
ISBN: 9780819496560
Publication Date:
2013
Book
! Metaphors of Confinement: The Prison in Fact, Fiction, and Fantasy
Author(s):
Fludernik
Information Provider:
Oxford University Press
ISBN: 9780198840909
Publication Date:
2019
Book
! Metaphysics and Cognitive Science
Editor(s):
Goldman
Information Provider:
Oxford University Press
ISBN: 9780190639679
Publication Date:
2019
Book
! Metaphysics and the Philosophy of Science
Author(s):
Slater
Information Provider:
Oxford University Press
ISBN: 9780199363209
Publication Date:
2017
Book
f Meteorologica | Centro Argentino de Meteorólogos
Information Provider:
Directory of Open Access Journals (DOAJ)
ISSN: 0325187x
E-ISSN: 1850468x
Journal
f Meteorologische Zeitschrift | Borntraeger
Information Provider:
Directory of Open Access Journals (DOAJ)
ISSN: 09412948
E-ISSN: 16101227
Journal
! Methods and Applications in Fluorescence
Information Provider:
IOP Publishing
E-ISSN: 20506120
Journal
f Methods and Applications of Analysis~International Press of Boston
Information Provider:
Project Euclid
ISSN: 10732772
E-ISSN: 19450001
Journal
f Methods and Protocols | MDPI AG
Information Provider:
Directory of Open Access Journals (DOAJ)
E-ISSN: 24099279
Journal
! Methods for Atmospheric Radiometry
Information Provider:
SPIE Digital Library
ISBN: 9780892521180
Publication Date:
1976
Book
! Methods for Ultrasensitive Detection
Editor(s):
Fearey, Bryan
Information Provider:
SPIE Digital Library
ISBN: 9780819427090
Publication Date:
1998
Book
! Methods for Ultrasensitive Detection II
Editor(s):
Wilkerson, Charles
Information Provider:
SPIE Digital Library
ISBN: 9780819443731
Publication Date:
2002
Book
! Methods in Bioethics
Author(s):
Arras
Information Provider:
Oxford University Press
ISBN: 9780190665982
Publication Date:
2017
Book
! Methods in Theoretical Quantum Optics
Author(s):
Barnett
Information Provider:
Oxford University Press
ISBN: 9780198563617
Publication Date:
2002
Book
f Methods of Functional Analysis and Topology | National Academy of Sciences of Ukraine. Institute of Mathematics
Information Provider:
Directory of Open Access Journals (DOAJ)
ISSN: 10293531
E-ISSN: 24157503
Journal
! Methods of Handling and Processing Imagery
Editor(s):
Marshall, Julian
Information Provider:
SPIE Digital Library
ISBN: 9780892527922
Publication Date:
1987
Book
f MethodsX | Elsevier
Information Provider:
Directory of Open Access Journals (DOAJ)
E-ISSN: 22150161
Journal
! Metrics for High-Quality Specular Surfaces
Author(s):
Baker, Lionel R.
Information Provider:
SPIE Digital Library
ISBN: 9780819455765
Publication Date:
2004
Book
! Metro and Access Networks
Editor(s):
Gu, Wanyi
Information Provider:
SPIE Digital Library
ISBN: 9780819443137
Publication Date:
2001
Book
! Metro and Access Networks II
Editor(s):
Gu, Wanyi
Information Provider:
SPIE Digital Library
ISBN: 9780819446978
Publication Date:
2002
Book
! Metro and Data Center Optical Networks and Short-Reach Links
Editor(s):
Srivastava, Atul
Information Provider:
SPIE Digital Library
ISBN: 9781510616059
Publication Date:
2018
Book
! Metro and Data Center Optical Networks and Short-Reach Links II
Editor(s):
Srivastava, Atul
Information Provider:
SPIE Digital Library
ISBN: 9781510625341
Publication Date:
2019
Book
! Metrologia
Information Provider:
IOP Publishing
ISSN: 00261394
E-ISSN: 16817575
Journal
! Metrology of Optoelectronic Systems
Editor(s):
Granger, Edward
Information Provider:
SPIE Digital Library
ISBN: 9780892528110
Publication Date:
1987
Book
! Metrology, Inspection, and Process Control for Microlithography X
Editor(s):
Jones, Susan
Information Provider:
SPIE Digital Library
ISBN: 9780819421012
Publication Date:
1996
Book
! Metrology, Inspection, and Process Control for Microlithography XI
Editor(s):
Jones, Susan
Information Provider:
SPIE Digital Library
ISBN: 9780819424648
Publication Date:
1997
Book
! Metrology, Inspection, and Process Control for Microlithography XII
Editor(s):
Singh, Bhanwar
Information Provider:
SPIE Digital Library
ISBN: 9780819427779
Publication Date:
1998
Book
! Metrology, Inspection, and Process Control for Microlithography XIII
Editor(s):
Singh, Bhanwar
Information Provider:
SPIE Digital Library
ISBN: 9780819431516
Publication Date:
1999
Book
! Metrology, Inspection, and Process Control for Microlithography XIV
Editor(s):
Sullivan, Neal
Information Provider:
SPIE Digital Library
ISBN: 9780819436160
Publication Date:
2000
Book
! Metrology, Inspection, and Process Control for Microlithography XIX
Editor(s):
Silver, Richard
Information Provider:
SPIE Digital Library
ISBN: 9780819457325
Publication Date:
2005
Book
! Metrology, Inspection, and Process Control for Microlithography XV
Editor(s):
Sullivan, Neal
Information Provider:
SPIE Digital Library
ISBN: 9780819440303
Publication Date:
2001
Book
! Metrology, Inspection, and Process Control for Microlithography XVI
Editor(s):
Herr, Daniel
Information Provider:
SPIE Digital Library
ISBN: 9780819444356
Publication Date:
2002
Book
! Metrology, Inspection, and Process Control for Microlithography XVII
Editor(s):
Herr, Daniel
Information Provider:
SPIE Digital Library
ISBN: 9780819448439
Publication Date:
2003
Book
! Metrology, Inspection, and Process Control for Microlithography XVIII
Editor(s):
Silver, Richard
Information Provider:
SPIE Digital Library
ISBN: 9780819452887
Publication Date:
2004
Book
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